If you have a chip that is 50% of the wafer area, a single fault will lead to a yield of 50%. Now compare it with a chip that is 1% of the wafer area, the same single fault gets a yield of 99%.
So comparing the yields of two processes without factoring in the die area is not a fair game.
Yield over die area should be the metric.
If you have a chip that is 50% of the wafer area, a single fault will lead to a yield of 50%. Now compare it with a chip that is 1% of the wafer area, the same single fault gets a yield of 99%.
So comparing the yields of two processes without factoring in the die area is not a fair game.